报告地点：催化楼一楼会议室

报告时间：2013年8月13日（星期二）上午10:00-11:00

报告人：Dr. Jiangyong Wang

Department of Physics, Shantou University 

报告摘要：

Interfaces (interphase boundaries and grain boundaries (GBs)) play an important role in the occurrence of phase transformations in thin solid films. Interface-mediated phase transformations, such as solid state amorphization in metal-metal multilayers, superheated melting in confined thin films, GB wetting and GB premelting have been a focal point of interest in recent years[1-2]. In this talk, the experimental results for the interface-mediated solid-state phase transformations occurred in amorphous Si(Ge)/Al(Ag, Au) and in Sn/Cu layered structures are presented. The origins of Si wetting Al GBs, Al-induced crystallization of amorphous Si and subsequent layer exchange in amorphous Si/Al layered structures and the Cu-Sn compound phase formations in Sn/Cu layered structures are discussed quantitatively on a unified thermodynamic basis[2-6].

Keywords：interface; interface-mediated phase transformation; MIC; thin film

References:

［1］     J.Y. Wang, D. He, Y.H. Zhao and E.J. Mittemeijer, Applied Physical Letters 88 (2006), 061910.

［2］     J.Y. Wang, Z.M. Wang and E.J. Mittemeijer, Journal of Applied Physics 102 (2007) 113523.

［3］     Z.M. Wang, J.Y. Wang, L.P.H. Jeurgens and E.J. Mittemeijer, Physical Review Letters 100 (2008) 125503.

［4］     Z.M. Wang, J.Y. Wang, L.P.H. Jeurgens and E.J. Mittemeijer, Physical Review B 77 (2008) 045424.

［5］     Z.M. Wang, L. Gu, F. Phillipp, J.Y. Wang, L.P.H. Jeurgens, and E.J. Mittemeijer, Advanced Materials 23 (2011) 854

［6］     Sobiech, M., C. Krüger, U. Welzel, J.Y. Wang, E.J. Mittemeijer and W. Hügel, Journal of Materials Research 26, (2011) 1482.

报告人简介：

Dr. JiangYong Wang received his Ph.D degree in 1997 at the University of the Free State in South Africa.In 1998, he moved to USA and worked as a research associate at the physics department at the Kansas State University. In 2001, he joined the Max Plank Institute for Metals Research in Stuttgart as a staff scientist. In 2009, he was appointed as a full professor at the physics department at the Shantou University in China. He has published more than 80 papers and book chapters, including PRL, Adv. Mat., PRB, APL, JAP. His scientific interests are diffusion and phase transformation in thin films, quantification of sputter depth profiling and surface segregation in bulk/thin film materials.  

报告联系人：502组 石瑛（9128）